000 02211cam a2200457 i 4500
001 9780429243011
003 FlBoTFG
005 20220509192915.0
006 m o d
007 cr cnu---unuuu
008 200928t20212021flu ob 001 0 eng
040 _aOCoLC-P
_beng
_erda
_cOCoLC-P
020 _a9780429243011
_qelectronic book
020 _a0429243014
_qelectronic book
020 _a9780429516160
_qelectronic book
020 _a0429516169
_qelectronic book
020 _a9780429512735
_qelectronic book
020 _a0429512732
_qelectronic book
020 _a9780429519598
_qelectronic book
020 _a0429519591
_qelectronic book
020 _z9780367197360
_qhardcover
035 _a(OCoLC)1198989124
035 _a(OCoLC-P)1198989124
050 0 0 _aQH212.S34
_bS33 2021
072 7 _aTEC
_x021000
_2bisacsh
072 7 _aTGM
_2bicssc
082 0 0 _a570.28/25
_223
245 0 0 _aScanning transmission electron microscopy :
_badvanced characterization methods for materials science applications /
_cedited by Alina Bruma.
264 1 _aBoca Raton, FL :
_bCRC Press,
_c2021.
264 4 _c©2021
300 _a1 online resource
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
520 _a"This book focuses on explaining and applying the principles of machine learning-based techniques and advanced image processing methods currently used in the electron microscopy community suitable for handling large electron microscopy data sets and extracting structure-property information for various materials. It explains and exemplifies how to use these methods in order to interpret STEM images and extract suitable information in order to reveal material properties at the nanoscale"--
_cProvided by publisher.
588 _aOCLC-licensed vendor bibliographic record.
650 0 _aScanning transmission electron microscopy
_xData processing.
650 7 _aTECHNOLOGY / Material Science
_2bisacsh
700 1 _aBruma, Alina,
_eeditor.
856 4 0 _3Taylor & Francis
_uhttps://www.taylorfrancis.com/books/9780429243011
856 4 2 _3OCLC metadata license agreement
_uhttp://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
999 _c126274
_d126274