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001 978-90-481-9379-0
003 DE-He213
005 20140220084603.0
007 cr nn 008mamaa
008 100929s2010 ne | s |||| 0|eng d
020 _a9789048193790
_9978-90-481-9379-0
024 7 _a10.1007/978-90-481-9379-0
_2doi
050 4 _aTK7888.4
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
082 0 4 _a621.3815
_223
100 1 _aAmara, Amara.
_eeditor.
245 1 0 _aEmerging Technologies and Circuits
_h[electronic resource] /
_cedited by Amara Amara, Thomas Ea, Marc Belleville.
264 1 _aDordrecht :
_bSpringer Netherlands,
_c2010.
300 _aX, 266 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aLecture Notes in Electrical Engineering,
_x1876-1100 ;
_v2021
505 0 _aSynergy Between Design and Technology: A Key Factor in the Evolving Microelectronic Landscape -- EMERGING TECHNOLOGY AND DEVICES -- New State Variable Opportunities Beyond CMOS: A System Perspective -- A Simple Compact Model to Analyze the Impact of Ballistic and Quasi-Ballistic Transport on Ring Oscillator Performance -- ADVANCED DEVICES AND CIRUITS -- Low-Voltage Scaled 6T FinFET SRAM Cells -- Independent-Double-Gate FINFET SRAM Cell for Drastic Leakage Current Reduction -- Metal Gate Effects on a 32 nm Metal Gate Resistor -- RELIABILITY AND SEU -- Threshold Voltage Shift Instability Induced by Plasma Charging Damage in MOSFETS with High-K Dielectric -- Analysis of SI Substrate Damage Induced by Inductively Coupled Plasma Reactor with Various Superposed Bias Frequencies -- POWER, TIMING AND VARIABILITY -- CMOS SOI Technology for WPAN: Application to 60 GHZ LNA -- SRAM Memory Cell Leakage Reduction Design Techniques in 65 nm Low Power PD-SOI CMOS -- Resilient Circuits for Dynamic Variation Tolerance -- Process Variability-Induced Timing Failures – A Challenge in Nanometer CMOS Low-Power Design -- How Does Inverse Temperature Dependence Affect Timing Sign-Off -- CMOS Logic Gates Leakage Modeling Under Statistical Process Variations -- On-Chip Circuit Technique for Measuring Jitter and Skew with Picosecond Resolution -- ANALOG AND MIXED SIGNAL -- DC–DC Converter Technologies for On-Chip Distributed Power Supply Systems – 3D Stacking and Hybrid Operation -- Sampled Analog Signal Processing: From Software-Defined to Software Radio.
520 _aWith the semiconductor market growth, new Integrated Circuit designs are pushing the limit of the technology and in some cases, require specific fine-tuning of certain process modules in manufacturing. Thus the communities of design and technology are increasingly intertwined. The issues that require close interactions and collaboration for trade-off and optimization across the design/device/process fields are addressed in Emerging Technologies and Circuits. It contains a set of outstanding papers, keynote and tutorials presented during 3 days at the International Conference On Integrated Circuit Design and Technology (ICICDT) held in June 2008 in Minatec, Grenoble. The selected papers are spread over 5 chapters covering various aspects of emerging technologies and devices, advanced circuit design, reliability, variability issues and solutions, advanced memories and analog and mixed signals. All these papers are focusing on design and technology interactions and comply with the scope of the conference.
650 0 _aEngineering.
650 0 _aMemory management (Computer science).
650 0 _aSystems engineering.
650 0 _aNanotechnology.
650 1 4 _aEngineering.
650 2 4 _aCircuits and Systems.
650 2 4 _aNanotechnology.
650 2 4 _aMemory Structures.
700 1 _aEa, Thomas.
_eeditor.
700 1 _aBelleville, Marc.
_eeditor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9789048193783
830 0 _aLecture Notes in Electrical Engineering,
_x1876-1100 ;
_v2021
856 4 0 _uhttp://dx.doi.org/10.1007/978-90-481-9379-0
912 _aZDB-2-ENG
999 _c113641
_d113641