000 03033nam a22004695i 4500
001 978-90-481-3443-4
003 DE-He213
005 20140220084558.0
007 cr nn 008mamaa
008 100301s2010 ne | s |||| 0|eng d
020 _a9789048134434
_9978-90-481-3443-4
024 7 _a10.1007/978-90-481-3443-4
_2doi
050 4 _aTK7888.4
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
082 0 4 _a621.3815
_223
100 1 _aHong, Dongwoo.
_eauthor.
245 1 0 _aEfficient Test Methodologies for High-Speed Serial Links
_h[electronic resource] /
_cby Dongwoo Hong, Kwang-Ting Cheng.
264 1 _aDordrecht :
_bSpringer Netherlands,
_c2010.
300 _aXII, 98p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aLecture Notes in Electrical Engineering,
_x1876-1100 ;
_v51
505 0 _aAn Efficient Jitter Measurement Technique -- BER Estimation for Linear Clock and Data Recovery Circuit -- BER Estimation for Non-linear Clock and Data Recovery Circuit -- Gaps in Timing Margining Test -- An Accurate Jitter Estimation Technique -- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers -- Conclusions.
520 _aWith the increasing demand for higher data bandwidth, communication systems’ data rates have reached the multi-gigahertz range and even beyond. Advances in semiconductor technologies have accelerated the adoption of high-speed serial interfaces, such as PCI-Express, Serial-ATA, and XAUI, in order to mitigate the high pin-count and the data-channel skewing problems. However, with the increasing number of I/O pins and greater data rates, significant challenges arise for testing high-speed interfaces in terms of test cost and quality, especially in high volume manufacturing (HVM) environments. Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.
650 0 _aEngineering.
650 0 _aComputer science.
650 0 _aSystems engineering.
650 1 4 _aEngineering.
650 2 4 _aCircuits and Systems.
650 2 4 _aRegister-Transfer-Level Implementation.
700 1 _aCheng, Kwang-Ting.
_eauthor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9789048134427
830 0 _aLecture Notes in Electrical Engineering,
_x1876-1100 ;
_v51
856 4 0 _uhttp://dx.doi.org/10.1007/978-90-481-3443-4
912 _aZDB-2-ENG
999 _c113353
_d113353