| 000 | 02549nam a22004095i 4500 | ||
|---|---|---|---|
| 001 | 978-3-8348-9624-7 | ||
| 003 | DE-He213 | ||
| 005 | 20140220084553.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 100403s2010 gw | s |||| 0|eng d | ||
| 020 |
_a9783834896247 _9978-3-8348-9624-7 |
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| 024 | 7 |
_a10.1007/978-3-8348-9624-7 _2doi |
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| 050 | 4 | _aQA75.5-76.95 | |
| 072 | 7 |
_aUY _2bicssc |
|
| 072 | 7 |
_aCOM014000 _2bisacsh |
|
| 082 | 0 | 4 |
_a004 _223 |
| 100 | 1 |
_aBaerisch, Stefan. _eauthor. |
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| 245 | 1 | 0 |
_aDomain-Specific Model-Driven Testing _h[electronic resource] / _cby Stefan Baerisch ; edited by Wilhelm Hasselbring. |
| 264 | 1 |
_aWiesbaden : _bVieweg+Teubner, _c2010. |
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| 300 |
_a260p. _bonline resource. |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
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| 338 |
_aonline resource _bcr _2rdacarrier |
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| 347 |
_atext file _bPDF _2rda |
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| 505 | 0 | _aTesting of Software -- Use of Models in Software Engineering -- System Families and Variability -- Information Retrieval and Digital Libraries -- The MTCC Approach -- Models for System and Test Representation -- Application of MTCC Models -- Application of MTCC to the Digital Library Domain -- Validation Goals and Design -- Results of the Validation -- Related Work -- Summary and Contributions -- Outlook and Conclusion. | |
| 520 | _aSoftware reuse and software quality are increasingly important topics in today’s software engineering both for researchers and for practitioners. The design and implementation of tests is especially challenging when tests are conceptualized for different variants and versions of an application. Stefan Baerisch applies a combination of feature modelling and code generation, for which he uses a model-driven approach, in order to facilitate the design of tests by non-programmers. Thus, the reuse of tests, represented by abstract test models, for different systems under tests is made possible. The approach uses code generation to allow test execution on heterogeneous and changing implementations. This combination of modelling and code generation allows for a more integrated and more efficient testing process. | ||
| 650 | 0 | _aComputer science. | |
| 650 | 1 | 4 | _aComputer Science. |
| 650 | 2 | 4 | _aComputer Science, general. |
| 700 | 1 |
_aHasselbring, Wilhelm. _eeditor. |
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| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer eBooks | |
| 776 | 0 | 8 |
_iPrinted edition: _z9783834809315 |
| 856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-3-8348-9624-7 |
| 912 | _aZDB-2-SCS | ||
| 999 |
_c113021 _d113021 |
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