| 000 | 03036nam a22004815i 4500 | ||
|---|---|---|---|
| 001 | 978-1-4419-6348-2 | ||
| 003 | DE-He213 | ||
| 005 | 20140220084509.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 100805s2010 xxu| s |||| 0|eng d | ||
| 020 |
_a9781441963482 _9978-1-4419-6348-2 |
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| 024 | 7 |
_a10.1007/978-1-4419-6348-2 _2doi |
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| 050 | 4 | _aTA169.7 | |
| 050 | 4 | _aT55-T55.3 | |
| 050 | 4 | _aTA403.6 | |
| 072 | 7 |
_aTGPR _2bicssc |
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| 072 | 7 |
_aTEC032000 _2bisacsh |
|
| 082 | 0 | 4 |
_a658.56 _223 |
| 100 | 1 |
_aMcPherson, J.W. _eauthor. |
|
| 245 | 1 | 0 |
_aReliability Physics and Engineering _h[electronic resource] : _bTime-To-Failure Modeling / _cby J.W. McPherson. |
| 264 | 1 |
_aBoston, MA : _bSpringer US : _bImprint: Springer, _c2010. |
|
| 300 |
_aXIII, 318 p. _bonline resource. |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
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| 338 |
_aonline resource _bcr _2rdacarrier |
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| 347 |
_atext file _bPDF _2rda |
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| 505 | 0 | _aMaterials and Device Degradation -- From Material/Device Degradation to Time-To-Failure -- Time-To-Failure Modeling -- Gaussian Statistics — An Overview -- Time-To-Failure Statistics -- Failure Rate Modeling -- Accelerated Degradation -- Acceleration Factor Modeling -- Ramp-to-Failure Testing -- Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits -- Time-To-Failure Models for Selected Failure Mechanisms in Mechanical Engineering -- Conversion of Dynamical Stresses into Effective Static Values -- Increasing the Reliability of Device/Product Designs -- Erratum to: Materials and Device Degradation. | |
| 520 | _aReliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products. Key features include: • Materials/Device Degradation • Degradation Kinetics • Time-To-Failure Modeling • Statistical Tools • Failure-Rate Modeling • Accelerated Testing • Ramp-To-Failure Testing • Important Failure Mechanisms for Integrated Circuits • Important Failure Mechanisms for Mechanical Components • Conversion of Dynamical Stresses into Static Equivalents • Small Design Changes Producing Major Reliability Improvements This textbook includes numerous example problems with solutions. Also, exercise problems along with answers are included at the end of each chapter. Reliability Physics and Engineering can be a useful resource for students, engineers and materials scientists. | ||
| 650 | 0 | _aEngineering. | |
| 650 | 0 | _aMechanical engineering. | |
| 650 | 0 | _aSystem safety. | |
| 650 | 0 | _aElectronics. | |
| 650 | 1 | 4 | _aEngineering. |
| 650 | 2 | 4 | _aQuality Control, Reliability, Safety and Risk. |
| 650 | 2 | 4 | _aElectronics and Microelectronics, Instrumentation. |
| 650 | 2 | 4 | _aMechanical Engineering. |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer eBooks | |
| 776 | 0 | 8 |
_iPrinted edition: _z9781441963475 |
| 856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-1-4419-6348-2 |
| 912 | _aZDB-2-ENG | ||
| 999 |
_c110621 _d110621 |
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