| 000 | 03722nam a22005415i 4500 | ||
|---|---|---|---|
| 001 | 978-3-642-18443-7 | ||
| 003 | DE-He213 | ||
| 005 | 20140220083754.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 110801s2011 gw | s |||| 0|eng d | ||
| 020 |
_a9783642184437 _9978-3-642-18443-7 |
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| 024 | 7 |
_a10.1007/978-3-642-18443-7 _2doi |
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| 050 | 4 | _aQC350-467 | |
| 050 | 4 | _aTA1501-1820 | |
| 050 | 4 | _aQC392-449.5 | |
| 050 | 4 | _aTA1750-1750.22 | |
| 072 | 7 |
_aTTB _2bicssc |
|
| 072 | 7 |
_aPHJ _2bicssc |
|
| 072 | 7 |
_aTEC030000 _2bisacsh |
|
| 082 | 0 | 4 |
_a621.36 _223 |
| 100 | 1 |
_aSeitz, Peter. _eeditor. |
|
| 245 | 1 | 0 |
_aSingle-Photon Imaging _h[electronic resource] / _cedited by Peter Seitz, Albert JP Theuwissen. |
| 264 | 1 |
_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2011. |
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| 300 |
_aXVIII, 354 p. _bonline resource. |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
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| 338 |
_aonline resource _bcr _2rdacarrier |
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| 347 |
_atext file _bPDF _2rda |
||
| 490 | 1 |
_aSpringer Series in Optical Sciences, _x0342-4111 ; _v160 |
|
| 505 | 0 | _aFundamentals of noise in optoelectronics -- Semiconductor technology for single-photon image sensing -- Hybrid Avalanche Photodiode Array (APD) Imaging -- Electron Bombarded Semiconductor Image Sensors -- Silicon Photomultipliers, SiPM -- Electron-Multiplying CDs, EMCCD -- Monolithic Single-Photon Avalanche Photodetectors, SPAD -- Single-photon CMOS imaging through bandwidth optimization -- Architectures for low-noise CMOS electronic imaging -- Low-noise electronic imaging with double-gate FETs and charge-modulation devices -- Energy-sensitive single-photon X-ray and particle imaging -- Single-photon imaging for astronomy and aerospace applications -- Single-photon imaging for the life sciences -- Single-photon imaging for time-of-flight range 3D imaging. | |
| 520 | _aThe acquisition and interpretation of images is a central capability in almost all scientific and technological domains. In particular, the acquisition of electromagnetic radiation, in the form of visible light, UV, infrared, X-ray, etc. is of enormous practical importance. The ultimate sensitivity in electronic imaging is the detection of individual photons. With this book, the first comprehensive review of all aspects of single-photon electronic imaging has been created. Topics include theoretical basics, semiconductor fabrication, single-photon detection principles, imager design and applications of different spectral domains. Today, the solid-state fabrication capabilities for several types of image sensors has advanced to a point, where uncoooled single-photon electronic imaging will soon become a consumer product. This book is giving a specialist´s view from different domains to the forthcoming “single-photon imaging” revolution. The various aspects of single-photon imaging are treated by internationally renowned, leading scientists and technologists who have all pioneered their respective fields. | ||
| 650 | 0 | _aPhysics. | |
| 650 | 0 | _aMicrowaves. | |
| 650 | 1 | 4 | _aPhysics. |
| 650 | 2 | 4 | _aOptics, Optoelectronics, Plasmonics and Optical Devices. |
| 650 | 2 | 4 | _aMicrowaves, RF and Optical Engineering. |
| 650 | 2 | 4 | _aAtomic, Molecular, Optical and Plasma Physics. |
| 650 | 2 | 4 | _aSpectroscopy and Microscopy. |
| 650 | 2 | 4 | _aSignal, Image and Speech Processing. |
| 700 | 1 |
_aTheuwissen, Albert JP. _eeditor. |
|
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer eBooks | |
| 776 | 0 | 8 |
_iPrinted edition: _z9783642184420 |
| 830 | 0 |
_aSpringer Series in Optical Sciences, _x0342-4111 ; _v160 |
|
| 856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-3-642-18443-7 |
| 912 | _aZDB-2-PHA | ||
| 999 |
_c107442 _d107442 |
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