000 02930nam a22005415i 4500
001 978-3-642-15868-1
003 DE-He213
005 20140220083748.0
007 cr nn 008mamaa
008 110302s2011 gw | s |||| 0|eng d
020 _a9783642158681
_9978-3-642-15868-1
024 7 _a10.1007/978-3-642-15868-1
_2doi
050 4 _aT174.7
072 7 _aTDPB
_2bicssc
072 7 _aTEC027000
_2bisacsh
082 0 4 _a620.5
_223
100 1 _aNazarov, Alexei.
_eeditor.
245 1 0 _aSemiconductor-On-Insulator Materials for Nanoelectronics Applications
_h[electronic resource] /
_cedited by Alexei Nazarov, J.-P. Colinge, Francis Balestra, Jean-Pierre Raskin, Francisco Gamiz, V.S. Lysenko.
264 1 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg,
_c2011.
300 _aIX, 400p. 118 illus., 18 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aEngineering Materials,
_x1612-1317
505 0 _aNew semiconductor-on-insulator materials -- Physics of modern SemOI devices -- Diagnostics of the SOI devices -- Sensors and MEMS on SOI.
520 _a"Semiconductor-On-Insulator Materials for NanoElectonics Applications” is devoted to the fast evolving field of modern nanoelectronics, and more particularly to the physics and technology of nanoelectronic devices built on semiconductor-on-insulator (SemOI) systems. The book contains the achievements in this field from leading companies and universities in Europe, USA, Brazil and Russia. It is articulated around four main topics: 1. New semiconductor-on-insulator materials; 2. Physics of modern SemOI devices; 3. Advanced characterization of SemOI devices; 4. Sensors and MEMS on SOI. "Semiconductor-On-Insulator Materials for NanoElectonics Applications” is useful not only to specialists in nano- and microelectronics but also to students and to the wider audience of readers who are interested in new directions in modern electronics and optoelectronics.
650 0 _aEngineering.
650 0 _aNanotechnology.
650 0 _aSurfaces (Physics).
650 1 4 _aEngineering.
650 2 4 _aNanotechnology and Microengineering.
650 2 4 _aNanotechnology.
650 2 4 _aSemiconductors.
650 2 4 _aCharacterization and Evaluation of Materials.
700 1 _aColinge, J.-P.
_eeditor.
700 1 _aBalestra, Francis.
_eeditor.
700 1 _aRaskin, Jean-Pierre.
_eeditor.
700 1 _aGamiz, Francisco.
_eeditor.
700 1 _aLysenko, V.S.
_eeditor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783642158674
830 0 _aEngineering Materials,
_x1612-1317
856 4 0 _uhttp://dx.doi.org/10.1007/978-3-642-15868-1
912 _aZDB-2-CMS
999 _c107094
_d107094