000			02863nam a22005055i 4500
001			978-1-4614-0445-3
003			DE-He213
005			20140220083732.0
007			cr nn 008mamaa
008			110705s2011 xxu| s |||| 0|eng d
020			_a9781461404453 _9978-1-4614-0445-3
024	7		_a10.1007/978-1-4614-0445-3 _2doi
050		4	_aTK7888.4
072		7	_aTJFC _2bicssc
072		7	_aTEC008010 _2bisacsh
082	0	4	_a621.3815 _223
100	1		_aCao, Yu. _eauthor.
245	1	0	_aPredictive Technology Model for Robust Nanoelectronic Design _h[electronic resource] / _cby Yu Cao.
264		1	_aBoston, MA : _bSpringer US, _c2011.
300			_aXV, 173 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
490	1		_aIntegrated Circuits and Systems, _x1558-9412
505	0		_a1. Introduction -- 2. Predictive Technology Model of Conventional CMOS Devices -- 3. Predictive Technology Model of Enhanced CMOS Devices -- 4. Statistical Extraction and Modeling of CMOS Variability -- 5. Modeling of Temporal Reliability Degradation -- 6. Modeling of Interconnect Parasitics -- 7. Design Benchmark with Predictive Technology Model -- 8. Predictive Process Design Kits -- 9. Predictive Modeling of Carbon Nanotube Devices -- 10. Predictive Technology Model for Future Nanoelectronic Design.
520			_aPredictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.
650		0	_aEngineering.
650		0	_aOperating systems (Computers).
650		0	_aElectronics.
650		0	_aSystems engineering.
650		0	_aNanotechnology.
650	1	4	_aEngineering.
650	2	4	_aCircuits and Systems.
650	2	4	_aElectronics and Microelectronics, Instrumentation.
650	2	4	_aNanotechnology.
650	2	4	_aPerformance and Reliability.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781461404446
830		0	_aIntegrated Circuits and Systems, _x1558-9412
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4614-0445-3
912			_aZDB-2-ENG
999			_c106251 _d106251