000 03314nam a22004575i 4500
001 978-1-4419-7418-1
003 DE-He213
005 20140220083723.0
007 cr nn 008mamaa
008 101110s2011 xxu| s |||| 0|eng d
020 _a9781441974181
_9978-1-4419-7418-1
024 7 _a10.1007/978-1-4419-7418-1
_2doi
050 4 _aTK7888.4
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
082 0 4 _a621.3815
_223
100 1 _aBhunia, Swarup.
_eeditor.
245 1 0 _aLow-Power Variation-Tolerant Design in Nanometer Silicon
_h[electronic resource] /
_cedited by Swarup Bhunia, Saibal Mukhopadhyay.
250 _a1.
264 1 _aBoston, MA :
_bSpringer US,
_c2011.
300 _aX, 240p. 100 illus.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aIntroduction and Motivation -- Background on Power Dissipation -- Background on Parameter Variations -- Low power Logic Design under Variations -- Low Power Memory Design under Variations -- System and Architecture Level Design -- Emerging Challenges and Solution Approach -- Conclusion and Discussion.
520 _aLow-Power Variation-Tolerant Design in Nanometer Silicon Edited by: Swarup Bhunia Saibal Mukhopadhyay Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. Low-power design techniques such as voltage scaling, dual-threshold assignment and gate sizing can have large negative impact on parametric yield under process variations. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations. Coverage includes logic and memory design, modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. •Introduces readers to some of the most important challenges in low-power and variation-tolerant IC design in nanoscale technologies; •Presents a holistic view of Low-Power Variation-Tolerant Design, at different levels of design abstraction, starting from device to circuit, architecture and system; •Offers comprehensive coverage of modeling, analysis and design methodology for low power and variation-tolerant logic circuits, memory and systems, micro-architecture, DSP, mixed-signal and FPGAs, including current industrial practices, technology scaling trends, and emerging challenges; •Describes in detail modeling and analysis of different variation effects (die-to-die and within-die, process and temporal) on low-power designs; Includes coverage of ultra low-power and robust sub-threshold design.
650 0 _aEngineering.
650 0 _aComputer aided design.
650 0 _aSystems engineering.
650 1 4 _aEngineering.
650 2 4 _aCircuits and Systems.
650 2 4 _aComputer-Aided Engineering (CAD, CAE) and Design.
700 1 _aMukhopadhyay, Saibal.
_eeditor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781441974174
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4419-7418-1
912 _aZDB-2-ENG
999 _c105761
_d105761