000 04187nam a22005895i 4500
001 978-0-85729-310-7
003 DE-He213
005 20140220083713.0
007 cr nn 008mamaa
008 110326s2011 xxk| s |||| 0|eng d
020 _a9780857293107
_9978-0-85729-310-7
024 7 _a10.1007/978-0-85729-310-7
_2doi
050 4 _aTA169.7
050 4 _aT55-T55.3
050 4 _aTA403.6
072 7 _aTGPR
_2bicssc
072 7 _aTEC032000
_2bisacsh
082 0 4 _a658.56
_223
100 1 _aTan, Cher Ming.
_eauthor.
245 1 0 _aApplications of Finite Element Methods for Reliability Studies on ULSI Interconnections
_h[electronic resource] /
_cby Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou.
250 _a1.
264 1 _aLondon :
_bSpringer London,
_c2011.
300 _aVIII, 152 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aSpringer Series in Reliability Engineering,
_x1614-7839
505 0 _a1. Introduction -- 2. Development of Physics-based Modeling for ULSI Interconnections Failure Mechanisms: Electromigration and Stress Induced Voiding -- 3. Introduction and General Theory of Finite Element Method -- 4. Finite Element Method for Electromigration Study -- 5. Finite Element Method for Stress Induced Voiding -- 6. Finite Element Method for Dielectric Reliability.
520 _aApplications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and continues to lead to a much better understanding of reliability physics. To help readers cope with the increasing sophistication of FEMs’ applications to interconnect reliability, Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections will: introduce the principle of FEMs; review numerical modeling of ULSI interconnect reliability; describe the physical mechanism of ULSI interconnect reliability encountered in the electronics industry; and discuss in detail the use of FEMs to understand and improve ULSI interconnect reliability from both the physical and practical perspective, incorporating the Monte Carlo method. A full-scale review of the numerical modeling methodology used in the study of interconnect reliability highlights useful and noteworthy techniques that have been developed recently. Many illustrations are used throughout the book to improve the reader’s understanding of the methodology and its verification. Actual experimental results and micrographs on ULSI interconnects are also included. Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections is a good reference for researchers who are working on interconnect reliability modeling, as well as for those who want to know more about FEMs for reliability applications. It gives readers a thorough understanding of the applications of FEM to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability.
650 0 _aEngineering.
650 0 _aDifferential equations, partial.
650 0 _aSystem safety.
650 0 _aElectronics.
650 0 _aOptical materials.
650 1 4 _aEngineering.
650 2 4 _aQuality Control, Reliability, Safety and Risk.
650 2 4 _aComputational Intelligence.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
650 2 4 _aOptical and Electronic Materials.
650 2 4 _aPartial Differential Equations.
700 1 _aLi, Wei.
_eauthor.
700 1 _aGan, Zhenghao.
_eauthor.
700 1 _aHou, Yuejin.
_eauthor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9780857293091
830 0 _aSpringer Series in Reliability Engineering,
_x1614-7839
856 4 0 _uhttp://dx.doi.org/10.1007/978-0-85729-310-7
912 _aZDB-2-ENG
999 _c105188
_d105188