000 02906nam a22004575i 4500
001 978-3-642-24121-5
003 DE-He213
005 20140220083303.0
007 cr nn 008mamaa
008 120103s2012 gw | s |||| 0|eng d
020 _a9783642241215
_9978-3-642-24121-5
024 7 _a10.1007/978-3-642-24121-5
_2doi
050 4 _aQC176-176.9
072 7 _aPNFS
_2bicssc
072 7 _aSCI077000
_2bisacsh
082 0 4 _a530.41
_223
100 1 _aLeitner, Michael.
_eauthor.
245 1 0 _aStudying Atomic Dynamics with Coherent X-rays
_h[electronic resource] /
_cby Michael Leitner.
264 1 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg,
_c2012.
300 _aX, 96p. 37 illus., 9 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aSpringer Theses
505 0 _aIntroduction -- Theory -- Linking Theory to Experiments -- Characteristics of Diffusion in Selected Systems -- Data Evaluation -- Considerations Concerning the Experiment -- Experimental Results -- Outlook -- Appendix.
520 _aDiffusion in solids at moderate temperatures is a well-known phenomenon.  However, direct experimental evidence about the responsible atomic-scale mechanisms has been scarce, due to difficulties in probing the relevant length- and time-scales. The present thesis deals with the application of X-ray Photon Correlation Spectroscopy (XPCS) for answering such questions. This is an established method for the study of slow dynamics on length-scales of a few nanometres. The scattered intensity in the diffuse regime, i.e. corresponding to atomic distances, is very low, however, and so it has so far been considered impossible to use XPCS for this problem. Threefold progress is reported in this work: It proposes a number of systems selected for high diffuse intensity, it optimizes the photon detection and data evaluation procedures, and it establishes theoretical models for interpretating the results. Together these advances allowed the first successful atomic-scale XPCS experiment, which elucidated the role of preferred configurations for atomic jumps in a copper-gold alloy. The growth in available coherent X-ray intensity together with next-generation X-ray sources will open up a wide field of application for this new method.
650 0 _aPhysics.
650 0 _aCrystallography.
650 1 4 _aPhysics.
650 2 4 _aSolid State Physics.
650 2 4 _aSpectroscopy and Microscopy.
650 2 4 _aCrystallography.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783642241208
830 0 _aSpringer Theses
856 4 0 _uhttp://dx.doi.org/10.1007/978-3-642-24121-5
912 _aZDB-2-PHA
999 _c102259
_d102259