000 02540nam a22004935i 4500
001 978-1-4614-4535-7
003 DE-He213
005 20140220083250.0
007 cr nn 008mamaa
008 120803s2012 xxu| s |||| 0|eng d
020 _a9781461445357
_9978-1-4614-4535-7
024 7 _a10.1007/978-1-4614-4535-7
_2doi
050 4 _aTJ265
050 4 _aQC319.8-338.5
072 7 _aTGMB
_2bicssc
072 7 _aSCI065000
_2bisacsh
082 0 4 _a621.4021
_223
100 1 _aPanigrahi, Pradipta Kumar.
_eauthor.
245 1 0 _aSchlieren and Shadowgraph Methods in Heat and Mass Transfer
_h[electronic resource] /
_cby Pradipta Kumar Panigrahi, Krishnamurthy Muralidhar.
264 1 _aNew York, NY :
_bSpringer New York :
_bImprint: Springer,
_c2012.
300 _aXI, 128 p. 69 illus., 17 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aSpringerBriefs in Applied Sciences and Technology,
_x2191-530X ;
_v2
505 0 _aOptical Methods - an Overview -- Laser Schlieren and Shadowgraph -- Rainbow Schlieren -- Principles of Tomography -- Validation Studies -- Closure.
520 _aSchlieren and Shadowgraph Methods in Heat and Mass Transfer lays out the fundamentals of refractive index based imaging techniques, optical configurations, image analysis, and three dimensional reconstructions. The present monograph aims at temperature and concentration measurements in transparent media using ray bending effects in a variable refractive index field. Data analysis procedure for three-dimensional reconstruction of temperature and concentration field using images at different view angles is presented. Test cases illustrating the validation of the quantitative analysis procedure are presented.  
650 0 _aEngineering.
650 0 _aThermodynamics.
650 0 _aMicrowaves.
650 1 4 _aEngineering.
650 2 4 _aEngineering Thermodynamics, Heat and Mass Transfer.
650 2 4 _aMicrowaves, RF and Optical Engineering.
650 2 4 _aThermodynamics.
700 1 _aMuralidhar, Krishnamurthy.
_eauthor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781461445340
830 0 _aSpringerBriefs in Applied Sciences and Technology,
_x2191-530X ;
_v2
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4614-4535-7
912 _aZDB-2-PHA
999 _c101506
_d101506