000 04383nam a22005295i 4500
001 978-1-4614-3436-8
003 DE-He213
005 20140220083247.0
007 cr nn 008mamaa
008 120825s2012 xxu| s |||| 0|eng d
020 _a9781461434368
_9978-1-4614-3436-8
024 7 _a10.1007/978-1-4614-3436-8
_2doi
050 4 _aTA404.6
072 7 _aTGMT
_2bicssc
072 7 _aTEC021000
_2bisacsh
082 0 4 _a620.11
_223
100 1 _aGault, Baptiste.
_eauthor.
245 1 0 _aAtom Probe Microscopy
_h[electronic resource] /
_cby Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer.
264 1 _aNew York, NY :
_bSpringer New York :
_bImprint: Springer,
_c2012.
300 _aXXIII, 396 p. 194 illus., 116 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aSpringer Series in Materials Science,
_x0933-033X ;
_v160
505 0 _aPreface -- Acknowledgements -- List of Acronyms and Abbreviations -- List of Terms -- List of Non-SI Units and Constant Values -- PART I Fundamentals -- 1. Introduction -- 2. Field Ion Microscopy -- 3 From Field Desorption Microscopy to Atom Probe Tomography -- Part II Practical aspects -- 4. Specimen Preparation -- 5. Experimental protocols in Field Ion Microscopy -- 6. Experimental protocols -- 7. Tomographic reconstruction -- PART III Applying atom probe techniques for materials science -- 8. Analysis techniques for atom probe tomography -- 9. Atom probe microscopy and materials science -- Appendices.
520 _aAtom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. Provides the most practical, up-to-date and critical review of  atom probe microscopy techniques Presents a detailed description of the analysis tools Includes practical examples of how the technique can be used in materials science research Stands as a must-have reference for any user of atom probe microscopy
650 0 _aNanochemistry.
650 0 _aNanotechnology.
650 0 _aSurfaces (Physics).
650 1 4 _aMaterials Science.
650 2 4 _aCharacterization and Evaluation of Materials.
650 2 4 _aNanoscale Science and Technology.
650 2 4 _aNanochemistry.
650 2 4 _aSpectroscopy and Microscopy.
650 2 4 _aNanotechnology.
700 1 _aMoody, Michael P.
_eauthor.
700 1 _aCairney, Julie M.
_eauthor.
700 1 _aRinger, Simon P.
_eauthor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781461434351
830 0 _aSpringer Series in Materials Science,
_x0933-033X ;
_v160
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4614-3436-8
912 _aZDB-2-CMS
999 _c101370
_d101370