000			03714nam a22005295i 4500
001			978-1-4614-2191-7
003			DE-He213
005			20140220083245.0
007			cr nn 008mamaa
008			120301s2012 xxu| s |||| 0|eng d
020			_a9781461421917 _9978-1-4614-2191-7
024	7		_a10.1007/978-1-4614-2191-7 _2doi
050		4	_aTA404.6
072		7	_aTGMT _2bicssc
072		7	_aTEC021000 _2bisacsh
082	0	4	_a620.11 _223
100	1		_aVogt, Thomas. _eeditor.
245	1	0	_aModeling Nanoscale Imaging in Electron Microscopy _h[electronic resource] / _cedited by Thomas Vogt, Wolfgang Dahmen, Peter Binev.
264		1	_aBoston, MA : _bSpringer US, _c2012.
300			_aXV, 265p. 80 illus., 32 illus. in color. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
490	1		_aNanostructure Science and Technology, _x1571-5744
505	0		_aStatistical and Information-Theoretic Analysis of Resolution in Imaging -- (Scanning) Transmission Electron Microscopy: Overview and Examples for the Non-Microscopist -- Seeing Atoms in the Crossroads of Microscopy and Mathematics -- Kantianism at the Nanoscale -- Reference free cryo-EM algorithms using self-consistent data fusion -- Reference free cryo-EM algorithms using self-consistent data fusion -- Applications of multivariate statistical analysis for large-scale spectrum-image datasets and atomic-resolution images -- Compressed Sensing -- Imaging the behavior of atoms, clusters and nanoparticles during elevated temperature experiments in an aberration-corrected electron microscope -- Towards Quantitative Imaging using Aberration Correction and Exit Wave Reconstruction -- Image registration, classification and averaging in cryo-electron tomography -- (Scanning) Transmission Electron Microscopy with High spatial, temporal and energy resolution -- Fluctuation Microscopy: Nanoscale Order in Amorphous Materials from Electron Nanodiffraction -- Information in super-resolution microscopy and automated analysis of large-scale calcium imaging data -- Concluding remarks on Imaging in Electron Microscopy.
520			_aModeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing
650		0	_aAnalytical biochemistry.
650		0	_aChemistry.
650		0	_aNanotechnology.
650		0	_aSurfaces (Physics).
650	1	4	_aMaterials Science.
650	2	4	_aCharacterization and Evaluation of Materials.
650	2	4	_aAnalytical Chemistry.
650	2	4	_aNanotechnology.
650	2	4	_aTheoretical and Computational Chemistry.
650	2	4	_aMeasurement Science and Instrumentation.
700	1		_aDahmen, Wolfgang. _eeditor.
700	1		_aBinev, Peter. _eeditor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781461421900
830		0	_aNanostructure Science and Technology, _x1571-5744
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4614-2191-7
912			_aZDB-2-CMS
999			_c101227 _d101227