000			03443nam a22004575i 4500
001			978-1-4614-0748-5
003			DE-He213
005			20140220083240.0
007			cr nn 008mamaa
008			110829s2012 xxu| s |||| 0|eng d
020			_a9781461407485 _9978-1-4614-0748-5
024	7		_a10.1007/978-1-4614-0748-5 _2doi
050		4	_aTK7888.4
072		7	_aTJFC _2bicssc
072		7	_aTEC008010 _2bisacsh
082	0	4	_a621.3815 _223
100	1		_aWolpert, David. _eauthor.
245	1	0	_aManaging Temperature Effects in Nanoscale Adaptive Systems _h[electronic resource] / _cby David Wolpert, Paul Ampadu.
264		1	_aNew York, NY : _bSpringer New York : _bImprint: Springer, _c2012.
300			_aXXII, 174p. 108 illus. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
505	0		_aThe Role of Temperature in Electronic Design -- Temperature Effects in Semiconductors -- Sensing Temperature Dependence -- Variation-Tolerant Adaptive Voltage Systems -- Controlling the Temperature Dependence -- Exploiting Temperature Dependence in Low-Swing Interconnect Links -- Avoiding Temperature-Induced Errors in On-Chip Interconnects -- Future Work and Open Problems.
520			_aThis book discusses new techniques for detecting, controlling, and exploiting the impacts of temperature variations on nanoscale circuits and systems.  It provides a holistic discussion of temperature management, including physical phenomena (reversal of the MOSFET temperature dependence) that have recently become problematic, along with circuit techniques for detecting, controlling, and adapting to these phenomena. A detailed discussion is also included of the general aspects of thermal-aware system design and management of temperature-induced faults. A new sensor system is described that can determine the temperature dependence as well as the operating temperature to improve system reliability.  A new method is presented to control a circuit’s temperature dependence by individually tuning pull-up and pull-down networks to their temperature-insensitive operating points. This method extends the range of supply voltages that can be made temperature-insensitive, achieving insensitivity at nominal voltage for the first time. Provides background on aspects of nanoscale circuits and systems that are affected by temperature, how they are affected by temperature, and what systems can be used to reduce these effects; Describes chip implementation details of a new type of temperature sensor that can ensure reliable operation across multiple temperature dependences; Includes new methods for achieving temperature insensitivity with example circuits and fabrication-related details such as process variation management.
650		0	_aEngineering.
650		0	_aElectronics.
650		0	_aSystems engineering.
650	1	4	_aEngineering.
650	2	4	_aCircuits and Systems.
650	2	4	_aElectronics and Microelectronics, Instrumentation.
650	2	4	_aNanotechnology and Microengineering.
700	1		_aAmpadu, Paul. _eauthor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781461407478
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4614-0748-5
912			_aZDB-2-ENG
999			_c100918 _d100918