000			03404nam a22005295i 4500
001			978-1-4471-2470-2
003			DE-He213
005			20140220083235.0
007			cr nn 008mamaa
008			120109s2012 xxk| s |||| 0|eng d
020			_a9781447124702 _9978-1-4471-2470-2
024	7		_a10.1007/978-1-4471-2470-2 _2doi
050		4	_aT174.7
072		7	_aTDPB _2bicssc
072		7	_aTEC027000 _2bisacsh
082	0	4	_a620.5 _223
100	1		_aLaurila, Tomi. _eauthor.
245	1	0	_aInterfacial Compatibility in Microelectronics _h[electronic resource] : _bMoving Away from the Trial and Error Approach / _cby Tomi Laurila, Vesa Vuorinen, Mervi Paulasto-Kröckel, Markus Turunen, Toni T. Mattila, Jorma Kivilahti.
264		1	_aLondon : _bSpringer London, _c2012.
300			_aIX, 217p. 128 illus., 15 illus. in color. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
490	1		_aMicrosystems, _x1389-2134
505	0		_aIntroduction: Away from trial and error methods -- Materials and interfaces in Microsystems -- Introduction to mechanics of materials -- Introduction to thermodynamic-kinetic method -- Interfacial adhesion in polymer systems -- Evolution of different types of interfacial structures.
520			_aInterfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system. In this difficult task, the “traditional” method of trial and error is not feasible anymore; it takes too much time and repeated efforts. In Interfacial Compatibility in Microelectronics, an alternative approach is introduced. In this revised method four fundamental disciplines are combined: i) thermodynamics of materials ii) reaction kinetics iii) theory of microstructures and iv) stress and strain analysis. The advantages of the method are illustrated in Interfacial Compatibility in Microelectronics which includes: •solutions to several common reliability issues in microsystem technology, •methods to understand and predict failure mechanisms at interfaces between dissimilar materials and •an approach to DFR based on deep understanding in materials science, rather than on the use of mechanistic tools, such as FMEA. Interfacial Compatibility in Microelectronics provides a clear and methodical resource for graduates and postgraduates alike.
650		0	_aEngineering.
650		0	_aOptical materials.
650		0	_aSurfaces (Physics).
650	1	4	_aEngineering.
650	2	4	_aNanotechnology and Microengineering.
650	2	4	_aSurfaces and Interfaces, Thin Films.
650	2	4	_aOptical and Electronic Materials.
700	1		_aVuorinen, Vesa. _eauthor.
700	1		_aPaulasto-Kröckel, Mervi. _eauthor.
700	1		_aTurunen, Markus. _eauthor.
700	1		_aMattila, Toni T. _eauthor.
700	1		_aKivilahti, Jorma. _eauthor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781447124696
830		0	_aMicrosystems, _x1389-2134
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4471-2470-2
912			_aZDB-2-ENG
999			_c100681 _d100681