000 02962nam a22004455i 4500
001 978-1-4419-6621-6
003 DE-He213
005 20140220083233.0
007 cr nn 008mamaa
008 111119s2012 xxu| s |||| 0|eng d
020 _a9781441966216
_9978-1-4419-6621-6
024 7 _a10.1007/978-1-4419-6621-6
_2doi
050 4 _aTK7888.4
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
082 0 4 _a621.3815
_223
100 1 _aDietrich, Manfred.
_eeditor.
245 1 0 _aProcess Variations and Probabilistic Integrated Circuit Design
_h[electronic resource] /
_cedited by Manfred Dietrich, Joachim Haase.
264 1 _aNew York, NY :
_bSpringer New York,
_c2012.
300 _aXVI, 252 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aIntroduction -- Physical and Mathematical Fundamentals -- Examination of Process Parameter Variations -- Methods of Parameter Variations -- Consequences for Circuits Design and Case Studies -- Conclusion.
520 _aUncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process.  Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.   This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits.  Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.  Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process; Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design; Describes critical effects of process variation using simple examples that can be reproduced by the reader.      
650 0 _aEngineering.
650 0 _aComputer aided design.
650 0 _aSystems engineering.
650 1 4 _aEngineering.
650 2 4 _aCircuits and Systems.
650 2 4 _aComputer-Aided Engineering (CAD, CAE) and Design.
700 1 _aHaase, Joachim.
_eeditor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781441966209
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4419-6621-6
912 _aZDB-2-ENG
999 _c100526
_d100526