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1.
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Introduction to Advanced System-on-Chip Test Design and Optimization [electronic resource] / by Erik Larsson.
by Larsson, Erik | SpringerLink (Online service). Source: Springer eBooksMaterial type:  Book; Format:
electronic
available online
 ; Literary form:
Not fiction
Publisher: Boston, MA : Springer US, 2005Online access: Click here to access online Availability: No items available
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2.
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Fault Diagnosis of Analog Integrated Circuits [electronic resource] / by Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha.
by Kabisatpathy, Prithviraj | Barua, Alok | Sinha, Satyabroto | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Boston, MA : Springer US, 2005Online access: Click here to access online Availability: No items available
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3.
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Data Mining and Diagnosing IC Fails [electronic resource] / by Leendert M. Huisman.
by Huisman, Leendert M | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Boston, MA : Springer US, 2005Online access: Click here to access online Availability: No items available
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4.
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Gizopoulos / Advances in ElectronicTesting [electronic resource] / edited by Dimitris Gizopoulos.
by Gizopoulos, Dimitris | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Boston, MA : Springer US, 2006Online access: Click here to access online Availability: No items available
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5.
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Digital Timing Measurements [electronic resource] : From Scopes and Probes to Timing and Jitter / by Wolfgang Maichen.
by Maichen, Wolfgang | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Boston, MA : Springer US, 2006Online access: Click here to access online Availability: No items available
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6.
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The Core Test Wrapper Handbook [electronic resource] : Rationale and Application of IEEE Std. 1500™ / by Francisco Silva, Teresa McLaurin, Tom Waayers.
by Silva, Francisco | McLaurin, Teresa | Waayers, Tom | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Boston, MA : Springer US, 2006Online access: Click here to access online Availability: No items available
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7.
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource] : 2nd Edition / edited by Manoj Sachdev, José Pineda de Gyvez.
by Sachdev, Manoj | Gyvez, José Pineda de | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Boston, MA : Springer US, 2007Online access: Click here to access online Availability: No items available
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8.
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Emerging Nanotechnologies [electronic resource] : Test, Defect Tolerance, and Reliability / edited by Mohammad Tehranipoor.
by Tehranipoor, Mohammad | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Boston, MA : Springer US, 2008Online access: Click here to access online Availability: No items available
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9.
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Oscillation-Based Test in Mixed-Signal Circuits [electronic resource] / by Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz.
by Sánchez, Gloria Huertas | García de la Vega, Diego Vázquez | Rueda, Adoración Rueda | Díaz, José Luis Huertas | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Dordrecht : Springer Netherlands, 2006Online access: Click here to access online Availability: No items available
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10.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies [electronic resource] : Process-Aware SRAM Design and Test / by Andrei Pavlov, Manoj Sachdev.
by Pavlov, Andrei | Sachdev, Manoj | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Dordrecht : Springer Netherlands, 2008Online access: Click here to access online Availability: No items available
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11.
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New Methods of Concurrent Checking [electronic resource] / by Michael Göessel, Vitaly Ocheretny, Egor Sogomonyan, Daniel Marienfeld.
by Göessel, Michael | Ocheretny, Vitaly | Sogomonyan, Egor | Marienfeld, Daniel | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Dordrecht : Springer Netherlands, 2008Online access: Click here to access online Availability: No items available
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12.
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Soft Errors in Modern Electronic Systems [electronic resource] / edited by Michael Nicolaidis.
by Nicolaidis, Michael | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Boston, MA : Springer US, 2011Online access: Click here to access online Availability: No items available
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13.
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Models in Hardware Testing [electronic resource] : Lecture Notes of the Forum in Honor of Christian Landrault / edited by Hans-Joachim Wunderlich.
by Wunderlich, Hans-Joachim | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Dordrecht : Springer Netherlands, 2010Online access: Click here to access online Availability: No items available
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14.
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Soft Errors in Modern Electronic Systems [electronic resource] / edited by Michael Nicolaidis.
by Nicolaidis, Michael [editor.] | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Boston, MA : Springer US : Imprint: Springer, 2011Online access: Click here to access online Availability: No items available
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15.
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Models in Hardware Testing [electronic resource] : Lecture Notes of the Forum in Honor of Christian Landrault / edited by Hans-Joachim Wunderlich.
by Wunderlich, Hans-Joachim [editor.] | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Dordrecht : Springer Netherlands, 2010Online access: Click here to access online Availability: No items available
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