Library Services | Technical University of Kenya catalog › Results of search for 'au:"Tan, Cher Ming."'

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	1.	Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections [electronic resource] / by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou. by Tan, Cher Ming \| Li, Wei \| Gan, Zhenghao \| Hou, Yuejin \| SpringerLink (Online service). Edition: 1.Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: London : Springer London, 2011Online access: Click here to access online Availability: No items available Add to cart (remove)
	2.	Electromigration Modeling at Circuit Layout Level [electronic resource] / by Cher Ming Tan, Feifei He. by Tan, Cher Ming [author.] \| He, Feifei [author.] \| SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Singapore : Springer Singapore : Imprint: Springer, 2013Online access: Click here to access online Availability: No items available Add to cart (remove)
	3.	Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections [electronic resource] / by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou. by Tan, Cher Ming [author.] \| Li, Wei [author.] \| Gan, Zhenghao [author.] \| Hou, Yuejin [author.] \| SpringerLink (Online service). Edition: 1.Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: London : Springer London, 2011Online access: Click here to access online Availability: No items available Add to cart (remove)

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