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1. Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections [electronic resource] / by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou.

by Tan, Cher Ming | Li, Wei | Gan, Zhenghao | Hou, Yuejin | SpringerLink (Online service).

Edition: 1.Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: London : Springer London, 2011Online access: Click here to access online Availability: No items available
2. Electromigration Modeling at Circuit Layout Level [electronic resource] / by Cher Ming Tan, Feifei He.

by Tan, Cher Ming [author.] | He, Feifei [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Singapore : Springer Singapore : Imprint: Springer, 2013Online access: Click here to access online Availability: No items available
3. Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections [electronic resource] / by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou.

by Tan, Cher Ming [author.] | Li, Wei [author.] | Gan, Zhenghao [author.] | Hou, Yuejin [author.] | SpringerLink (Online service).

Edition: 1.Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: London : Springer London, 2011Online access: Click here to access online Availability: No items available

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