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1. Thermal and Power Management of Integrated Circuits [electronic resource] / by Arman Vassighi, Manoj Sachdev.

by Vassighi, Arman | Sachdev, Manoj | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2006Online access: Click here to access online Availability: No items available
2. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource] : 2nd Edition / edited by Manoj Sachdev, José Pineda de Gyvez.

by Sachdev, Manoj | Gyvez, José Pineda de | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2007Online access: Click here to access online Availability: No items available
3. ESD Protection Device and Circuit Design for Advanced CMOS Technologies [electronic resource] / by Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev.

by Semenov, Oleg | Sarbishaei, Hossein | Sachdev, Manoj | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Dordrecht : Springer Netherlands, 2008Online access: Click here to access online Availability: No items available
4. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies [electronic resource] : Process-Aware SRAM Design and Test / by Andrei Pavlov, Manoj Sachdev.

by Pavlov, Andrei | Sachdev, Manoj | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Dordrecht : Springer Netherlands, 2008Online access: Click here to access online Availability: No items available

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