Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials - Breitenstein, Otwin; Warta, Wilhelm; Langenkamp, Martin; SpringerLink (Online service) (Berlin, Heidelberg : Springer Berlin Heidelberg, 2010)
Keywords: Physics; Engineering; Materials; Surfaces (Physics).; Physics; Optics, Optoelectronics, Plasmonics and Optical Devices; Characterization and Evaluation of Materials; Engineering, general; Structural Materials