Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings - Yeung, Dit-Yan.; Kwok, James T.; Fred, Ana.; Roli, Fabio; Ridder, Dick.; SpringerLink (Online service) (Berlin, Heidelberg : Springer Berlin Heidelberg, 2006)
Keywords: Computer science; Computational complexity; Artificial intelligence; Computer graphics; Computer vision; Optical pattern recognition; Computer Science; Pattern Recognition; Discrete Mathematics in Computer Science; Artificial Intelligence (incl. Robotics).; Computer Graphics; Image Processing and Computer Vision