Microscopy of Semiconducting Materials c - Cullis, A. G.; Hutchison, J. L.; SpringerLink (Online service) (Berlin, Heidelberg : Springer Berlin Heidelberg, 2005)
Keywords: Chemistry; Weights and measures; Particles (Nuclear physics).; Electronics; Chemistry; Materials Science; Solid State Physics and Spectroscopy; Measurement Science, Instrumentation; Electronics and Microelectronics, Instrumentation