Reliability of Microtechnology Interconnects, Devices and Systems - Liu, Johan; Salmela, Olli.; Sarkka, Jussi; Morris, James E.; Tegehall, Per-Erik.; Andersson, Cristina; SpringerLink (Online service) (New York, NY : Springer New York, 2011)
Keywords: Engineering; System safety; Electronics; Optical materials; Engineering; Electronics and Microelectronics, Instrumentation; Optical and Electronic Materials; Quality Control, Reliability, Safety and Risk; Nanotechnology and Microengineering