Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud; SpringerLink (Online service) (Boston, MA : Springer US, 2010)
Keywords: Engineering; Computer aided design; Systems engineering; Engineering; Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design