Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections - Tan, Cher Ming.; Li, Wei.; Gan, Zhenghao; Hou, Yuejin; SpringerLink (Online service) (London : Springer London, 2011)
Keywords: Engineering; Differential equations, partial; System safety; Electronics; Optical materials; Engineering; Quality Control, Reliability, Safety and Risk; Computational Intelligence; Electronics and Microelectronics, Instrumentation; Optical and Electronic Materials; Partial Differential Equations