Fundamentals of Nanoscale Film Analysis - Alford, Terry L.; Feldman, Leonard C.; Mayer, James W.; SpringerLink (Online service) (Boston, MA : Springer US, 2007)
Keywords: Chemistry; Condensed matter; Particles (Nuclear physics).; Electronics; Nanotechnology; Surfaces (Physics).; Chemistry; Characterization and Evaluation of Materials; Surfaces and Interfaces, Thin Films; Nanotechnology; Solid State Physics and Spectroscopy; Condensed Matter; Electronics and Microelectronics, Instrumentation