Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM - Egerton, Ray F.; SpringerLink (Online service) (Boston, MA : Springer US, 2005)
Keywords: Chemistry; Microscopy; Electromagnetism; Nanotechnology; Surfaces (Physics).; Chemistry; Characterization and Evaluation of Materials; Nanotechnology; Biological Microscopy; Electromagnetism, Optics and Lasers