Energy-Efficient Fault-Tolerant Systems [electronic resource] / edited by Jimson Mathew, Rishad A. Shafik, Dhiraj K. Pradhan.
By: Mathew, Jimson [editor.].
Contributor(s): Shafik, Rishad A [editor.] | Pradhan, Dhiraj K [editor.] | SpringerLink (Online service).
Material type:
BookPublisher: New York, NY : Springer New York : Imprint: Springer, 2014Description: XIV, 335 p. 132 illus., 51 illus. in color. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9781461441939.Subject(s): Engineering | Microwaves | Systems engineering | Renewable energy sources | Engineering | Circuits and Systems | Semiconductors | Renewable and Green Energy | Applied and Technical Physics | Microwaves, RF and Optical Engineering | Optics, Optoelectronics, Plasmonics and Optical DevicesDDC classification: 621.3815 Online resources: Click here to access online Evolution of Fault Tolerant Design -- Fault and Reliability Models -- Energy Efficient Design Techniques -- Error Correction Coding -- System-level Reliable Design -- Fault Tolerant -- Finite Field Arithmetic Circuit Design and Testing Techniques -- Reliable Network-on-Chip Architectures -- Energy Efficient Reconfigurable Systems -- Bio-Inspired Online Fault Detection in NoC Interconnect -- Fault-tolerant dynamically reconfigurable NoC-based SoC.
This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented. · Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability; · Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches; · Includes discussion of emerging issues related to technology scaling, next generation memory and logic design.
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