Library Services | Technical University of Kenya

Your cart is empty.
Normal view MARC view ISBD view

Advanced Statistical Steganalysis [electronic resource] / by Rainer Böhme.

By: Böhme, Rainer.
Contributor(s): SpringerLink (Online service).
Material type: materialTypeLabelBookSeries: Information Security and Cryptography, 0.Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010Description: digital.ISBN: 9783642143137.Subject(s): Computer science | Data encryption (Computer science) | Computer vision | Computer Science | Image Processing and Computer Vision | Data Encryption | Signal, Image and Speech ProcessingDDC classification: 006.6 | 006.37 Online resources: Click here to access online In: Springer eBooks
Tags from this library: No tags from this library for this title. Log in to add tags.
No physical items for this record

There are no comments for this item.

Log in to your account to post a comment.

2017 | The Technical University of Kenya Library | +254(020) 2219929, 3341639, 3343672 | library@tukenya.ac.ke | Haile Selassie Avenue