Normal view MARC view ISBD view

Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications [electronic resource] : 14th Iberoamerican Conference on Pattern Recognition, CIARP 2009, Guadalajara, Jalisco, Mexico, November 15-18, 2009. Proceedings / edited by Eduardo Bayro-Corrochano, Jan-Olof Eklundh.

By: Bayro-Corrochano, Eduardo.
Contributor(s): Eklundh, Jan-Olof | SpringerLink (Online service).
Material type: materialTypeLabelBookSeries: Lecture Notes in Computer Science, 5856.Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009Description: digital.ISBN: 9783642102684.Subject(s): Computer science | Artificial intelligence | Computer vision | Optical pattern recognition | Biometrics | Computer Science | Pattern Recognition | Image Processing and Computer Vision | Artificial Intelligence (incl. Robotics) | Computer Imaging, Vision, Pattern Recognition and Graphics | BiometricsDDC classification: 006.4 Online resources: Click here to access online In: Springer eBooks
Tags from this library: No tags from this library for this title. Log in to add tags.
No physical items for this record

There are no comments for this item.

Log in to your account to post a comment.

2017 | The Technical University of Kenya Library | +254(020) 2219929, 3341639, 3343672 | library@tukenya.ac.ke | Haile Selassie Avenue