Library Services | Technical University of Kenya

Your cart is empty.
Normal view MARC view ISBD view

New Horizons of Applied Scanning Electron Microscopy [electronic resource] / by Kenichi Shimizu, Tomoaki Mitani.

By: Shimizu, Kenichi.
Contributor(s): Mitani, Tomoaki | SpringerLink (Online service).
Material type: materialTypeLabelBookSeries: Springer Series in Surface Sciences, 45.Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010Description: digital.ISBN: 9783642031601.Subject(s): Engineering | Nanotechnology | Surfaces (Physics) | Materials Science | Surfaces and Interfaces, Thin Films | Measurement Science and Instrumentation | Solid State Physics | Spectroscopy and Microscopy | Nanotechnology | Nanotechnology and MicroengineeringDDC classification: 620.44 Online resources: Click here to access online In: Springer eBooks
Tags from this library: No tags from this library for this title. Log in to add tags.
No physical items for this record

There are no comments for this item.

Log in to your account to post a comment.

2017 | The Technical University of Kenya Library | +254(020) 2219929, 3341639, 3343672 | library@tukenya.ac.ke | Haile Selassie Avenue