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Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] / by Brent Fultz, James M. Howe.

By: Fultz, Brent.
Contributor(s): Howe, James M | SpringerLink (Online service).
Material type: materialTypeLabelBookPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2008Edition: Third Edition.Description: digital.ISBN: 9783540738862.Subject(s): Chemistry | Particles (Nuclear physics) | Crystallography | Surfaces (Physics) | Chemistry | Characterization and Evaluation of Materials | Surfaces and Interfaces, Thin Films | Crystallography | Solid State Physics and Spectroscopy | Physics and Applied Physics in EngineeringOnline resources: Click here to access online In: Springer eBooks
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