Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings / edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick Ridder.
By: Yeung, Dit-Yan.
Contributor(s): Kwok, James T | Fred, Ana | Roli, Fabio | Ridder, Dick | SpringerLink (Online service).
Material type:
BookSeries: Lecture Notes in Computer Science, 4109.Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006Description: digital.ISBN: 9783540372417.Subject(s): Computer science | Computational complexity | Artificial intelligence | Computer graphics | Computer vision | Optical pattern recognition | Computer Science | Pattern Recognition | Discrete Mathematics in Computer Science | Artificial Intelligence (incl. Robotics) | Computer Graphics | Image Processing and Computer VisionDDC classification: 006.4 Online resources: Click here to access online
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