Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching [electronic resource] : Application to Rough and Natural Surfaces / by Gerd Kaupp.
By: Kaupp, Gerd.
Contributor(s): SpringerLink (Online service).
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BookPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006Description: digital.ISBN: 9783540284727.Subject(s): Chemistry | Chemistry, Physical organic | Biochemistry | Life sciences | Physical optics | Nanotechnology | Chemistry | Nanotechnology | Applied Optics, Optoelectronics, Optical Devices | Physics and Applied Physics in Engineering | Physical Chemistry | Medical Biochemistry | Life Sciences, generalOnline resources: Click here to access online
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