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CCD Image Sensors in Deep-Ultraviolet [electronic resource] : Degradation Behavior and Damage Mechanisms / by Flora M. Li, Arokia Nathan.

By: Li, Flora M.
Contributor(s): Nathan, Arokia | SpringerLink (Online service).
Material type: materialTypeLabelBookSeries: Microtechnology and Mems.Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005Description: digital.ISBN: 9783540274124.Subject(s): Chemistry | Spectrum analysis | Electronics | Optical materials | Chemistry | Optical and Electronic Materials | Optical Spectroscopy, Ultrafast Optics | Physics and Applied Physics in Engineering | Electronics and Microelectronics, InstrumentationOnline resources: Click here to access online In: Springer eBooks
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