Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces [electronic resource] / by Weronika Walkosz.
By: Walkosz, Weronika.
Contributor(s): SpringerLink (Online service).
Material type:
BookSeries: Springer Theses.Publisher: New York, NY : Springer New York, 2011Description: digital.ISBN: 9781441978172.Subject(s): Microreactors | Chemistry, Physical organic | Materials | Materials Science | Ceramics, Glass, Composites, Natural Methods | Spectroscopy and Microscopy | Physical Chemistry | Structural Materials | Atomic/Molecular Structure and Spectra | MicroengineeringDDC classification: 620.14 Online resources: Click here to access online
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