Normal view MARC view ISBD view

Reliability of Nanoscale Circuits and Systems [electronic resource] : Methodologies and Circuit Architectures / by Miloš Stanisavljević, Alexandre Schmid, Yusuf Leblebici.

By: Stanisavljević, Miloš.
Contributor(s): Schmid, Alexandre | Leblebici, Yusuf | SpringerLink (Online service).
Material type: materialTypeLabelBookPublisher: New York, NY : Springer New York, 2011Description: digital.ISBN: 9781441962171.Subject(s): Engineering | Computer aided design | System safety | Systems engineering | Engineering | Circuits and Systems | Quality Control, Reliability, Safety and Risk | Computer-Aided Engineering (CAD, CAE) and DesignDDC classification: 621.3815 Online resources: Click here to access online In: Springer eBooks
Tags from this library: No tags from this library for this title. Log in to add tags.
No physical items for this record

There are no comments for this item.

Log in to your account to post a comment.

2017 | The Technical University of Kenya Library | +254(020) 2219929, 3341639, 3343672 | library@tukenya.ac.ke | Haile Selassie Avenue