Advanced Test Methods for SRAMs [electronic resource] : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel.
By: Bosio, Alberto.
Contributor(s): Dilillo, Luigi | Girard, Patrick | Pravossoudovitch, Serge | Virazel, Arnaud | SpringerLink (Online service).
Material type:
BookPublisher: Boston, MA : Springer US, 2010Edition: 1.Description: digital.ISBN: 9781441909381.Subject(s): Engineering | Computer aided design | Systems engineering | Engineering | Circuits and Systems | Computer-Aided Engineering (CAD, CAE) and DesignDDC classification: 621.3815 Online resources: Click here to access online
In:
Springer eBooks
No physical items for this record
There are no comments for this item.