Design for Manufacturability and Yield for Nano-Scale CMOS [electronic resource] / by Charles C. Chiang, Jamil Kawa.
By: Chiang, Charles C.
Contributor(s): Kawa, Jamil | SpringerLink (Online service).
Material type:
BookSeries: Series on Integrated Circuits and Systems.Publisher: Dordrecht : Springer Netherlands, 2007Description: digital.ISBN: 9781402051883.Subject(s): Computer science | Software engineering | Computer aided design | Electronics | Systems engineering | Nanotechnology | Computer Science | Circuits and Systems | Electronics and Microelectronics, Instrumentation | Computer-Aided Engineering (CAD, CAE) and Design | Processor Architectures | Software Engineering/Programming and Operating Systems | NanotechnologyDDC classification: 621.3815 Online resources: Click here to access online
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