Applied Rasch Measurement: A Book of Exemplars [electronic resource] : Papers in Honour of John P. Keeves / edited by Rupert Maclean, Ryo Watanabe, Robyn Baker, Boediono, Yin Cheong Cheng, Wendy Duncan, John Keeves, Zhou Mansheng, Colin Power, J. S. Rajput, Konai Helu Thaman, Sivakumar Alagumalai, David D. Curtis, Njora Hungi.
By: Maclean, Rupert.
Contributor(s): Watanabe, Ryo | Baker, Robyn | Boediono | Cheng, Yin Cheong | Duncan, Wendy | Keeves, John | Mansheng, Zhou | Power, Colin | Rajput, J. S | Thaman, Konai Helu | Alagumalai, Sivakumar | Curtis, David D | Hungi, Njora | SpringerLink (Online service).
Material type:
BookSeries: Education in the Asia-Pacific Region: Issues, Concerns and Prospects ; 4.Publisher: Dordrecht : Springer Netherlands, 2005Description: digital.ISBN: 9781402030765.Subject(s): Education | Distribution (Probability theory) | Comparative education | Education | Education (general) | Comparative Education | Probability Theory and Stochastic ProcessesDDC classification: 370 Online resources: Click here to access online
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Springer eBooks
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