Nanometer Technology Designs High-Quality Delay Tests [electronic resource] / by Mohammad Tehranipoor, Nisar Ahmed.
By: Tehranipoor, Mohammad.
Contributor(s): Ahmed, Nisar | SpringerLink (Online service).
Material type:
BookPublisher: Boston, MA : Springer US, 2008Description: digital.ISBN: 9780387757285.Subject(s): Engineering | Computer aided design | Computer engineering | Electronics | Systems engineering | Nanotechnology | Engineering | Circuits and Systems | Electronics and Microelectronics, Instrumentation | Computer-Aided Engineering (CAD, CAE) and Design | Nanotechnology | Electrical EngineeringDDC classification: 621.3815 Online resources: Click here to access online
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Springer eBooks
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