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Digital Noise Monitoring of Defect Origin [electronic resource] / by Telman Aliev.

By: Aliev, Telman.
Contributor(s): SpringerLink (Online service).
Material type: materialTypeLabelBookPublisher: Boston, MA : Springer US, 2007Description: digital.ISBN: 9780387717548.Subject(s): Engineering | Mathematics | Telecommunication | Engineering | Signal, Image and Speech Processing | Applications of Mathematics | Communications Engineering, Networks | Electronic and Computer EngineeringDDC classification: 621.382 Online resources: Click here to access online In: Springer eBooks
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