Scanning Probe Microscopy [electronic resource] : Electrical and Electromechanical Phenomena at the Nanoscale / edited by Sergei Kalinin, Alexei Gruverman.
By: Kalinin, Sergei.
Contributor(s): Gruverman, Alexei | SpringerLink (Online service).
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BookPublisher: New York, NY : Springer New York, 2007Description: digital.ISBN: 9780387286686.Subject(s): Chemistry | Microscopy | Particles (Nuclear physics) | Mechanical engineering | Nanotechnology | Surfaces (Physics) | Chemistry | Characterization and Evaluation of Materials | Nanotechnology | Surfaces and Interfaces, Thin Films | Biological Microscopy | Mechanical Engineering | Solid State Physics and SpectroscopyOnline resources: Click here to access online
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