Reliability Physics and Engineering (Record no. 96358)

000 -LEADER
fixed length control field 03889nam a22005055i 4500
001 - CONTROL NUMBER
control field 978-3-319-00122-7
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140220082837.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 130604s2013 gw | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783319001227
-- 978-3-319-00122-7
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-3-319-00122-7
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7800-8360
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7874-7874.9
072 #7 - SUBJECT CATEGORY CODE
Subject category code TJF
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC008000
Source bisacsh
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC008070
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.381
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name McPherson, J. W.
Relator term author.
245 10 - TITLE STATEMENT
Title Reliability Physics and Engineering
Medium [electronic resource] :
Remainder of title Time-To-Failure Modeling /
Statement of responsibility, etc by J. W. McPherson.
250 ## - EDITION STATEMENT
Edition statement 2nd ed. 2013.
264 #1 -
-- Heidelberg :
-- Springer International Publishing :
-- Imprint: Springer,
-- 2013.
300 ## - PHYSICAL DESCRIPTION
Extent XVI, 399 p. 171 illus., 124 illus. in color.
Other physical details online resource.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Introduction -- Materials and Device Degradation -- From Material/Device Degradation to Time-To-Failure -- Time-To-Failure Modeling -- Gaussian Statistics – An Overview -- Time-To-Failure Statistics -- Failure Rate Modeling -- Accelerated Degradation -- Acceleration Factor Modeling -- Ramp-To-Failure Testing -- Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits Breakdown (TDDB) -- Time-To-Failure Models for Selected Failure Mechanisms In Mechanical Engineering -- Conversion of Dynamical Stresses Into Effective Static Values -- Increasing the Reliability of Device/Product Designs -- Screening -- Heat Generation and Dissipation -- Sampling Plans and Confidence Intervals -- Appendix A: Useful Conversion Factors -- Appendix B: Useful Physical Constants -- Appendix C: Useful Rough Rules-Of-Thumb -- Appendix D: Useful Mathematical Expressions -- Appendix E: Useful Differentials and Definite Integrals -- Appendix F: Free-Energy -- Appendix G: t(1-α/2,ν) Distribution Values -- Appendix H: χ2(P,ν) Distribution Values -- Index.
520 ## - SUMMARY, ETC.
Summary, etc Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products. Key features include:  ·       Materials/Device Degradation ·       Degradation Kinetics ·       Time-To-Failure Modeling ·       Statistical Tools ·       Failure-Rate Modeling ·       Accelerated Testing ·       Ramp-To-Failure Testing ·       Important Failure Mechanisms for Integrated Circuits ·       Important Failure Mechanisms for  Mechanical Components ·       Conversion of Dynamic  Stresses into Static Equivalents ·       Small Design Changes Producing Major Reliability Improvements ·       Screening Methods ·       Heat Generation and Dissipation ·       Sampling Plans and Confidence Intervals This textbook includes numerous example problems with solutions. Also, exercise problems along with the answers are included at the end of each chapter. Reliability Physics and Engineering can be a very useful resource for students, engineers, and materials scientists.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Mathematical statistics.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element System safety.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electronics.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electronics and Microelectronics, Instrumentation.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Quality Control, Reliability, Safety and Risk.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Statistical Theory and Methods.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Energy, general.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9783319001210
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-3-319-00122-7
912 ## -
-- ZDB-2-ENG

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