Frontiers in Optical Methods (Record no. 93433)

000 -LEADER
fixed length control field 03597nam a22005415i 4500
001 - CONTROL NUMBER
control field 978-3-642-40594-5
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140220082521.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 131204s2014 gw | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783642405945
-- 978-3-642-40594-5
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-3-642-40594-5
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TA1671-1707
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TA1501-1820
072 #7 - SUBJECT CATEGORY CODE
Subject category code TTBL
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC019000
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.36
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Shudo, Ken-ichi.
Relator term editor.
245 10 - TITLE STATEMENT
Title Frontiers in Optical Methods
Medium [electronic resource] :
Remainder of title Nano-Characterization and Coherent Control /
Statement of responsibility, etc edited by Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno.
264 #1 -
-- Berlin, Heidelberg :
-- Springer Berlin Heidelberg :
-- Imprint: Springer,
-- 2014.
300 ## - PHYSICAL DESCRIPTION
Extent XII, 228 p. 139 illus., 70 illus. in color.
Other physical details online resource.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
490 1# - SERIES STATEMENT
Series statement Springer Series in Optical Sciences,
International Standard Serial Number 0342-4111 ;
Volume number/sequential designation 180
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note State-of-Art of Terahertz Science and Technology -- Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films -- Single Photon Counting and Passive Microscopy of Terahertz Radiation -- Coherent Phonons in Carbon Nanotubes -- Time-resolved X-ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation -- Imaging GHz-THz Acoustic Wave Propagation in Thin Films and Microstructures -- Material Evaluation with Various Optical Measurement Systems: Focusing on Terahertz Spectroscopy -- Ultrafast Excitation and Dynamics Measurements with Intense Ultrashort Laser Pulses: High-Order Harmonic Generation from Aligning Molecules and Surface Nanostructuring -- Real Space Mapping of Exciton Interaction Strength in GaN Films by using Four-Wave-Mixing Technique -- Terahertz Light Source Based on Synchrotron Radiation -- Terahertz Synchrotron Radiation; Optics and Application -- Far-infrared Spectroscopy on Solids under Ultra High Pressures -- Real-time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy.
520 ## - SUMMARY, ETC.
Summary, etc This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Physics.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Microwaves.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Nanotechnology.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Physics.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Laser Technology, Photonics.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Atomic, Molecular, Optical and Plasma Physics.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Optics, Optoelectronics, Plasmonics and Optical Devices.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Spectroscopy and Microscopy.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Microwaves, RF and Optical Engineering.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Nanotechnology.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Katayama, Ikufumui.
Relator term editor.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Ohno, Shin-Ya.
Relator term editor.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9783642405938
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Springer Series in Optical Sciences,
-- 0342-4111 ;
Volume number/sequential designation 180
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-3-642-40594-5
912 ## -
-- ZDB-2-PHA

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