Theoretical Concepts of X-Ray Nanoscale Analysis (Record no. 93228)

000 -LEADER
fixed length control field 03117nam a22005055i 4500
001 - CONTROL NUMBER
control field 978-3-642-38177-5
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140220082517.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 130906s2014 gw | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783642381775
-- 978-3-642-38177-5
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-3-642-38177-5
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number T50
072 #7 - SUBJECT CATEGORY CODE
Subject category code PDDM
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code SCI068000
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 530.8
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Benediktovich, Andrei.
Relator term author.
245 10 - TITLE STATEMENT
Title Theoretical Concepts of X-Ray Nanoscale Analysis
Medium [electronic resource] :
Remainder of title Theory and Applications /
Statement of responsibility, etc by Andrei Benediktovich, Ilya Feranchuk, Alexander Ulyanenkov.
264 #1 -
-- Berlin, Heidelberg :
-- Springer Berlin Heidelberg :
-- Imprint: Springer,
-- 2014.
300 ## - PHYSICAL DESCRIPTION
Extent XIII, 318 p. 108 illus., 37 illus. in color.
Other physical details online resource.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
490 1# - SERIES STATEMENT
Series statement Springer Series in Materials Science,
International Standard Serial Number 0933-033X ;
Volume number/sequential designation 183
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Basic principles of the interaction between X-rays and matter -- X-ray reflectivity -- High-resolution X-ray diffraction -- Grazing-incidence small-angle X-ray scattering -- Theory of X-ray scattering from imperfect crystals -- X-ray diffraction for evaluation of residual stresses in polycrystals -- Methods of mathematical and physical optimization of X-ray data analysis.
520 ## - SUMMARY, ETC.
Summary, etc This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Physics.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Surfaces (Physics).
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Physics.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Measurement Science and Instrumentation.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Characterization and Evaluation of Materials.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Theoretical, Mathematical and Computational Physics.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Applied and Technical Physics.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Spectroscopy and Microscopy.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Feranchuk, Ilya.
Relator term author.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Ulyanenkov, Alexander.
Relator term author.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9783642381768
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Springer Series in Materials Science,
-- 0933-033X ;
Volume number/sequential designation 183
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-3-642-38177-5
912 ## -
-- ZDB-2-PHA

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