Robust Computing with Nano-scale Devices (Record no. 113480)

000 -LEADER
fixed length control field 03673nam a22005055i 4500
001 - CONTROL NUMBER
control field 978-90-481-8540-5
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140220084600.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 100316s2010 ne | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9789048185405
-- 978-90-481-8540-5
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-90-481-8540-5
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7888.4
072 #7 - SUBJECT CATEGORY CODE
Subject category code TJFC
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC008010
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Huang, Chao.
Relator term editor.
245 10 - TITLE STATEMENT
Title Robust Computing with Nano-scale Devices
Medium [electronic resource] :
Remainder of title Progresses and Challenges /
Statement of responsibility, etc edited by Chao Huang.
264 #1 -
-- Dordrecht :
-- Springer Netherlands :
-- Imprint: Springer,
-- 2010.
300 ## - PHYSICAL DESCRIPTION
Extent VIII, 200p.
Other physical details online resource.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
490 1# - SERIES STATEMENT
Series statement Lecture Notes in Electrical Engineering,
International Standard Serial Number 1876-1100 ;
Volume number/sequential designation 58
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Fault Tolerant Nanocomputing -- Transistor-Level Based Defect-Tolerance for Reliable Nanoelectronics -- Fault-Tolerant Design for Nanowire-Based Programmable Logic Arrays -- Built-In Self-Test and Defect Tolerance for Molecular Electronics-Based NanoFabrics -- The Prospect and Challenges of CNFET Based Circuits: A Physical Insight -- Computing with Nanowires: A Self Assembled Neuromorphic Architecture -- Computational Opportunities and CAD for Nanotechnologies.
520 ## - SUMMARY, ETC.
Summary, etc Although complementary metal-oxide semiconductor (CMOS) technology will continue dominating the digital electronic circuits for the next 10-15 years, a number of grand challenges have emerged as the transistor size scales down. The rising costs of semiconductor mask and fabrication pose economic barriers to lithography. The quantum effects and increasing leakage power begin setting physical limits on continuous CMOS feature size shrinking. The research advances of innovative nano-scale devices have created great opportunities to surpass the barriers faced by CMOS technology, which include nanowires, carbon nanotube transistors, programmable molecular switches, resonant tunneling diodes, quantum dots, etc. However, the success of many nanotechnologies relies on the self-assembly fabrication process to fabricate circuits. The stochastic self-assembly fabrication, unfortunately, has low reliability with defect densities several orders of magnitude higher than conventional CMOS technology. Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Computer science.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electronic data processing.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Systems engineering.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Nanotechnology.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Circuits and Systems.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Nanotechnology.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Processor Architectures.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Computing Methodologies.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9789048185399
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Lecture Notes in Electrical Engineering,
-- 1876-1100 ;
Volume number/sequential designation 58
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-90-481-8540-5
912 ## -
-- ZDB-2-ENG

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