Scanning Probe Microscopy of Functional Materials (Record no. 105700)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 04443nam a22004095i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 978-1-4419-7167-8 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | DE-He213 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20140220083722.0 |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
| fixed length control field | cr nn 008mamaa |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 101212s2011 xxu| s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781441971678 |
| -- | 978-1-4419-7167-8 |
| 024 7# - OTHER STANDARD IDENTIFIER | |
| Standard number or code | 10.1007/978-1-4419-7167-8 |
| Source of number or code | doi |
| 050 #4 - LIBRARY OF CONGRESS CALL NUMBER | |
| Classification number | TA404.6 |
| 072 #7 - SUBJECT CATEGORY CODE | |
| Subject category code | TGMT |
| Source | bicssc |
| 072 #7 - SUBJECT CATEGORY CODE | |
| Subject category code | TEC021000 |
| Source | bisacsh |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 620.11 |
| Edition number | 23 |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Kalinin, Sergei V. |
| Relator term | editor. |
| 245 10 - TITLE STATEMENT | |
| Title | Scanning Probe Microscopy of Functional Materials |
| Medium | [electronic resource] : |
| Remainder of title | Nanoscale Imaging and Spectroscopy / |
| Statement of responsibility, etc | edited by Sergei V. Kalinin, Alexei Gruverman. |
| 264 #1 - | |
| -- | New York, NY : |
| -- | Springer New York, |
| -- | 2011. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | XVIII, 600p. 277 illus., 219 illus. in color. |
| Other physical details | online resource. |
| 336 ## - | |
| -- | text |
| -- | txt |
| -- | rdacontent |
| 337 ## - | |
| -- | computer |
| -- | c |
| -- | rdamedia |
| 338 ## - | |
| -- | online resource |
| -- | cr |
| -- | rdacarrier |
| 347 ## - | |
| -- | text file |
| -- | |
| -- | rda |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | I. Emergent phenomena in strongly-correlated systems: Phase separation and novel quaziparticles in nanowires -- STM of ruthenates and manganites -- STM of superconductors -- STM of cuprates -- II. Semiconductor and photovoltaic materials: SPM of solar materials -- Cross-sectional STM of semiconductor heterostructures -- Charge dynamics in photovoltaic polymers -- III. Functional probing of biosystems and macromolecules: Molecular Imaging of biomembranes single molecules with electrically functionalized probes -- AFM/patch clamp in biology -- Electrical imaging of membranes -- Cell dynamics by Ion conductance microscopy -- Ferroelectric polymers -- IV. SPM of magnetic materials: Spin manipulation by STM -- Magnetic Resonant Force Microscopy -- Magnetic Force Microscopy -- V. Electromechanics on the nanoscale: ferroelectrics and multiferroics: New dynamic modes and energy dissipation in SPM -- Polarization dynamics in relaxor ferroelectrics -- Piezoresponse Force Spectroscopy -- Polarization dynamics in capacitors and heterostructures -- VI. Mechanical properties: Nanomechanics by SPM -- Atomic Force Acoustic Microscopy of functional materials -- VII. Optical methods: NSOM and NSOM-transport -- NSOM -- Optical machines and unfolding -- Optically-assisted pump-probe STM -- VIII. Emerging SPM applications: STM/NC-AFM -- Scanning Non-linear Dielectric Microscopy -- Vibrational spectroscopy of single molecule -- Ultrafast ac STM -- SPM and electron microscopy combined -- In-situ STEM-nanoindentation -- Material characterization by SPM-focused X-ray combination -- *see Long ToC for tentative contributors. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging applications of spectroscopic imaging and multifrequency SPM methods, thermomechanical characterization, ion-conductance microscopy, as well as combined SPM-mass spectrometry, SPM-patch clamp, and SPM-focused X-ray applications. By bringing together critical reviews by leading researchers on the application of SPM to the nanoscale characterization of functional materials properties, Scanning Probe Microscopy of Functional Materials provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology. Key Features: •Serves the rapidly developing field of nanoscale characterization of functional materials properties •Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors •Focuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations •Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Surfaces (Physics). |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Materials Science. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Characterization and Evaluation of Materials. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Gruverman, Alexei. |
| Relator term | editor. |
| 710 2# - ADDED ENTRY--CORPORATE NAME | |
| Corporate name or jurisdiction name as entry element | SpringerLink (Online service) |
| 773 0# - HOST ITEM ENTRY | |
| Title | Springer eBooks |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
| Display text | Printed edition: |
| International Standard Book Number | 9781441965677 |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | http://dx.doi.org/10.1007/978-1-4419-7167-8 |
| 912 ## - | |
| -- | ZDB-2-CMS |
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