Kelvin Probe Force Microscopy (Record no. 102066)

000 -LEADER
fixed length control field 03146nam a22005055i 4500
001 - CONTROL NUMBER
control field 978-3-642-22566-6
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140220083259.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 111020s2012 gw | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783642225666
-- 978-3-642-22566-6
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-3-642-22566-6
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TA418.7-418.76
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TA418.9.T45
072 #7 - SUBJECT CATEGORY CODE
Subject category code TGM
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code PNRX
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC021000
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 620.44
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Sadewasser, Sascha.
Relator term editor.
245 10 - TITLE STATEMENT
Title Kelvin Probe Force Microscopy
Medium [electronic resource] :
Remainder of title Measuring and Compensating Electrostatic Forces /
Statement of responsibility, etc edited by Sascha Sadewasser, Thilo Glatzel.
264 #1 -
-- Berlin, Heidelberg :
-- Springer Berlin Heidelberg,
-- 2012.
300 ## - PHYSICAL DESCRIPTION
Extent XIV, 334 p.
Other physical details online resource.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
490 1# - SERIES STATEMENT
Series statement Springer Series in Surface Sciences,
International Standard Serial Number 0931-5195 ;
Volume number/sequential designation 48
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Introduction -- I. Technical Aspects -- Experimental technique and working modes -- Phase Modulation Kelvin Probe Microscopy -- Data interpretation, spatial resolution and deconvolution -- Contribution of the numerical approach to Kelvin probe force microscopies -- Quantum mechanical simulations of electrostatic tip-sample interactions -- II. Selected Applications -- Surface properties of III-V semiconductors -- Electronic surface properties of semiconductors devices -- Optoelectronic studies of solar cells -- Electrical characterization of low dimensional systems (quantum/nano-structures) -- Electronic structure of molecular assemblies -- KPFM for biochemical analysis -- Local work function analysis of photo catalysts -- Kelvin probe force microscopy with atomic resolution -- Summary.
520 ## - SUMMARY, ETC.
Summary, etc In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Thermodynamics.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Surfaces (Physics).
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Materials Science.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Surfaces and Interfaces, Thin Films.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Thermodynamics.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering Thermodynamics, Heat and Mass Transfer.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Glatzel, Thilo.
Relator term editor.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9783642225659
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Springer Series in Surface Sciences,
-- 0931-5195 ;
Volume number/sequential designation 48
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-3-642-22566-6
912 ## -
-- ZDB-2-CMS

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